Auger Electron Spectroscopy (AES) Lab Services
Auger Electron Spectroscopy (AES), also known as Auger Electron Spectroscopy, is a highly sensitive surface analysis technique based on the Auger effect. It can obtain the elemental composition and chemical state information of the topmost atomic layers (typically 0.5-10 nm) of a material surface, with a detection limit as low as 0.1 at% (atomic percent), and is capable of qualitatively detecting all elements except hydrogen (H) and helium (He) (from lithium to uranium).
Service Capabilities
Surface Elemental Qualitative and Semi-Quantitative Analysis: Identifies the types of elements present on the material surface and calculates their relative content (wt% or at%) using the Relative Sensitivity Factor (RSF) method.
Micro-area Comprehensive Analysis: Possesses nanoscale spatial resolution (up to 4-10 nm), supporting point analysis, line scanning, and area scanning (Mapping) to simultaneously acquire micro-area morphology, element types, content, and two-dimensional distribution information.
Depth Profile Analysis: Combined with argon ion sputtering/etching technology, it sequentially peels off the material surface layer by layer to analyze the distribution changes of elements and chemical states along the depth direction (from a few nanometers to hundreds of nanometers).
Chemical State Analysis: Analyzes the chemical binding state, valence state, and electronic structure information of elements through the shift of Auger peak positions and changes in peak shapes.